Communications-Random Processes [GATE (Graduate Aptitude Test in Engineering) Electronics]: Questions 1 - 4 of 8

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Question 1

CommunicationsRandom ProcessesFiltering of Random Signals through LTI Systems

Appeared in Year: 2013

Question MCQ▾

Out of the following memory types, one that is volatile is (June)

Choices

Choice (4)Response

a.

Magnetic disc

b.

Ferrite core

c.

Semiconductor RAM

d.

Semiconductor ROM

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Question 2

CommunicationsRandom ProcessesFiltering of Random Signals through LTI Systems

Appeared in Year: 2014

Question Match List-Ⅰ List-Ⅱ▾

Match the following lists: (June)

List-Ⅰ (Column-I)List-Ⅱ (Column-II)
(A)

Partition Noise

(i)

Resistance

(B)

Shot Noise

(ii)

Triode

(C)

Johnson Noise

(iii)

P-N junction

(D)

Current Noise

(iv)

Diode

Choices

Choice (4)Response
  • (A)
  • (B)
  • (C)
  • (D)

a.

  • (iii)
  • (ii)
  • (i)
  • (iv)

b.

  • (iii)
  • (ii)
  • (iv)
  • (i)

c.

  • (iii)
  • (i)
  • (ii)
  • (iv)

d.

  • (ii)
  • (iv)
  • (i)
  • (iii)

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Question 3

CommunicationsRandom ProcessesAutocorrelation and Power Spectral Density

Appeared in Year: 2016

Question Numeric Answer▾

Light from free space is incident at an angle to the normal of the facet of a step index large core optical fibre. The core and cladding refractive indices are and , respectively.

The Incident Light Will be Guided in the Core of the Fibbre

The maximum value of (in degrees) for which the incident light will be guided in the core of the fibre is …

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Question 4

CommunicationsRandom ProcessesAutocorrelation and Power Spectral Density

Appeared in Year: 2015

Question MCQ▾

Which one of the following process is preferred to form the gate dielectric (Si ) of MOSFETs?

Choices

Choice (4)Response

a.

Dry oxidation

b.

Molecular beam epitaxy

c.

Sputtering

d.

Wet oxidation

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